Ariswan
CdTe polycrystalline thin films had been fabricated using vacuum evaporation technique. Their properties had been investigated using X-ray diffraction, energy dispersive spectroscopy (EDS), scanning electron microscope (SEM) and uv-vis spectroscopy. The results showed that the CdTe thin films crystalized at hexagonal structure with lattice parameters a = 6.45 Å and c =7.66 Å. The EDS results showed that the chemical composition was non stoichiometry, slightly rich of Tellerium with Cd/Te of 0.9. It had a uniform shape with color homogenity and an optical band gap at room temperature about 1.47eV. © (2014) Trans Tech Publications, Switzerland.
Physics Department, Yogyakarta State University, Indonesia
